Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.* Memory cell structures and fabrication technologies.* Application-specific memories and architectures.* Memory design, fault modeling and test algorithms, limitations, and trade-offs.* Space environment, radiation hardening process and design techniques, and radiation testing.* Memory stacks and multichip modules for gigabyte storage.
Categorie:
Anno:
2002
Edizione:
1
Casa editrice:
Wiley-IEEE Press
Lingua:
english
Pagine:
473
ISBN 10:
0780310004
ISBN 13:
9780780310001
File:
PDF, 11.31 MB
IPFS:
,
english, 2002